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Instrument Database:
Foss A/S - Dryer Analyzer
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| Year of introduction |
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| Status |
available |
| Company |
Foss A/S
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| Categories |
Spectrometer ( Molec. ): NIR
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The FOSS Dryer™ Analyzer provides quick and accurate in-situ analysis of moisture and common solvents in powder drying processes in the pharmaceutical and chemical industries. Non-destructive measurements are obtained directly in the dryer and require no additional sample handling or sample extraction devices. The Dryer Analyzer from FOSS is based upon our patented ‚field proven Process Analytics™ near-infrared scanning technology, which provides high quality measurement stability and superior analytical performance. The Dryer Analyzer is configured to provide economical, accurate and reliable measurements of moisture and solvents in pharmaceutical and chemical powders. Two Analyzer configurations provide for measurement of up to either four or nine drying operations, allowing a more cost effective means of measurement.
The Dryer Analyzer is interfaced to your dryer by using small bundles of high quality fiber optics and interactance reflectance probes. This economical means of performing remote measurements enables the Analyzer to be installed in an unrestricted area, which reduces the installation and operation costs. The Dryer Analyzer is provided with validatable Vision ® Spectral Analysis software for Windows. Benefits and Features
Direct in-line measurement removes manual sampling requirements
Real-time moisture/solvent measurement improves productivity/throughput and reduces risk of "over/under-drying"
Reduced cost per measurement point through multiplexing of up to nine drying processes/sample points.
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| Specifications |
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Wavelength Range
Basic/ Enhanced Configuration 850 - 1650nm
Photometric Range
3.0A, 850 - 1650nm
Operating Range
5.0A, 850 - 1650nm
RMS Noise at 0.0 Absorbance
850 - 1650nm < 50uA
Data Interval
2.0nm
Scan Speed
1.1 scans/second
Detector
Indium Gallium Arsenide/ InGaAs (850 - 1650 nm)
Wavelength Accuracy (SD)
Based on instrument-to-instrument repeatability: 0.15nm
Based on currently accepted wavelength standards: 0.50nm
Instrument Wavelength Precision (SD)
0.015nm
Wavelength Linearity
1% of reading
Spectral Bandwidth
10nm ± 1nm (Reflectance)
Operating Temperature
60-90°F (15 - 32°C) nominal.
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