|
Instrument Database:
Kratos Analytical - EDX-700/EDX-800
| |
|
|
| |
|
| |
|
| Year of introduction |
|
| Status |
historical ( out of sale ) |
| Company |
Kratos Analytical
|
| Categories |
X-ray spectrometer: XRF
|
UltraCompact X-Ray Fluorescence Spectrometer
Simultaneous Measurement of Carbon - Uranium at the Touch of a Button.
Intuitive pre-configured software makes analysis easy for the novice.
Powerful and flexible software for the Experienced User for Advanced Analysis.
The X-ray Fluorescence (XRF) spectrometer is an instrument that quantitatively determines the elements comprising a sample. This is achieved by applying X-rays to a sample and then analyzing the re-emitted fluorescent X-rays. The technique of XRF is nondestructive for all sample types, including: solid, powder, liquid, disks, and wafers. Consequently XRF is used for R&D and quality control in a wide range of applications, including universities, research institutions, electronics industries and the metals industry.
The two models offered are the EDX-700 and the EDX-800. The EDX-700 is used for determination of Na - U (z=11 to z=92), and the EDX-800, for determination of C - U (z=6 - 92).
Features
- A large sample chamber with an automatic opening and closing door.... first in the world.
- The large sample compartment accepts a sample up to 300mm dia. x 150mm height max.
- Furthermore, the instrument can be combined with an automatic sample changer that operates at the touch of a button. (Patent Pending).
- Quantitative analysis software for analysis of unknown materials. Software permits analysis of thin films and organic substances. Plating thickness and composition analysis software is also provided. Furthermore, the Background fundamental Parameter is employed. This technique uses scattered X-rays in addition to fluorescent X-rays for analysis. This allows thick polymer films to be measured for thickness and organic materials to be analyzed.
- Content matching software providing standardless analysis is included. The EDX-700/800 can automatically identify all elements in a sample based upon a library of X-ray data.
- In addition to this standard feature, quantitative information is also provided. This is achieved through the use of content matching software. This method compares the X-ray intensity to theoretical and pre-measured values of different samples. For example the user will be able to distinguish different metals without needing costly standards.
- Five types of filter are included as standard for high sensitivity analysis. Filters are helpful in increasing the signal to noise ratio in many types of sample.
- Significantly lower-detection limits are achieved using this method.
- Compact desk-top unit Dimensions of the main unit are:
- 580(W) x 650(D) x 420(H)mm
- Fully automatic analysis can be set up to be run at the touch of a button.
- Windows ® 95/98 platform. The instrument is simple enough to be used by almost anyone, yet powerful enough for even the most experienced users.
- Advanced semi-conductor detector technology. Liquid Nitrogen needs only to be added at the time of analysis. This greatly simplifies the operation of the unit, as well as maintenance.
- System can be configured to run in vacuum, or helium as an added option. The instrument is simple enough to be used by almost anyone, yet powerful enough for even the most experienced users.
|
|
