noise

The random component of a set of measurement data, caused by the uncontrollable phenomena that affect all parts of the experimental setup. Random (or white) noise is reduced by a factor equal to the square root of r, where r is the number of repetitive measurements.



The term "noise" was found in the following pages:

Instrument database: Agilent Technologies Inc. - 1100 Series Multiple Wavelength Detector SL
Instrument database: Kratos Analytical - Micro EDX
Instrument database: ESA Inc. - 5600A CoulArray
Instrument database: Agilent Technologies Inc. - G1315B (1200 Series) Diode-array Detector
Instrument database: Agilent Technologies Inc. - G1362A (1200 Series) Refractive Index Detector
Instrument database: Shimadzu Europe - GC-2010 Plus
Instrument database: Thermo Scientific - Q Exactive™ Plus Hybrid Quadrupole-Orbitrap™ Mass Spectrometer
Instrument database: Fisons - PlasmaQuad III (PQ III)
Instrument database: Dionex Corporation - PDA-100 Photodiode Array Detector
Instrument database: Varian Inc. (Part A) - Cary 6000i UV-Vis-NIR spectrophotometer
Instrument database: Agilent Technologies Inc. - 7000C Triple Quadrupole GC/MS System
Instrument database: Thermo Scientific - Orbitrap Exploris 120 Mass Spectrometer
Instrument database: Dionex Corporation - MSQ Plus Mass Spectrometric Detector
Instrument database: Shimadzu Europe - IR Prestige-21
Journals database: Journal of the Acoustical Society of America
Instrument database: SCP Science - SP-1000 Jaw Crusher
Instrument database: Varian Inc. (Part A) - Cary 4000 UV-Vis spectrophotometer
Instrument database: Fisons - PQ ExCell
Instrument database: Agilent Technologies Inc. - 1100 Series Multiple Wavelength Detector
Instrument database: Agilent Technologies Inc. - G1314C (1200 Series) Variable Wavelength Detector SL