SIMS

Secondary ion mass spectrometry (SIMS) is a mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5- 20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra- high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio.

EVISA Instrument Database: SIMS systems



The term "SIMS" was found in the following pages:

ISM 2022: 8th International Symposium on Metallomics | EVISA's Agenda of Events
Cancelled: ESAS 2020: European Symposium on Atomic Spectrometry | EVISA's Agenda of Events
ESAS-CSSC: European Symposium on Analytical Spectrometry 2022 /17th Czech-Slovak Spectroscopic Conference | EVISA's Agenda of Events
Books and Special Issues on Elemental Speciation (published since 2011) | EVISA's News
Books and Special Issues on Elemental Speciation (published since 2016) | EVISA's News
ISM 2022: 8th Internation Symposium on Metallomics | EVISA's Agenda of Events
All about Mass Spectrometry: Resources related to Mass Spectrometry | EVISA's News
Spectr'Atom 2022 | EVISA's Agenda of Events
Instrument database: CAMECA SAS - IMS 7f / 7f-GEO
Instrument database: CAMECA SAS - SIMS 4600
Instrument database: CAMECA SAS - NanoSIMS 50/ 50L
Instrument database: AMD Intectra GmbH - AMD 402 S and AMD 604 S
ESAS 2014: European Symposium on Atomic Spectrometry / 15th Czech -Slovak Spectroscopic Conference | EVISA's Agenda of Events
Speciation and Toxicity: Humic Acids Increase Lead Bioavailability and Toxicity for Marine Invertebrates | EVISA's News
Instrument database: JEOL - JAMP-9500F
SIMS Europe 2018 | EVISA's Agenda of Events
Instrument database: ION-TOF GmbH - TOF.SIMS 5
Instrument database: Physical Electronics - TRIFT IV TOF-SIMS
Instrument database: Kore Technology - MS-1000 Compact Secondary Ion Time-Of-Flight Mass Spectrometer for Surface Analysis
Journals database: Spectroscopy (Eugene, Oreg.)