SIMS

Secondary ion mass spectrometry (SIMS) is a mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5- 20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra- high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio.

EVISA Instrument Database: SIMS systems



The term "SIMS" was found in the following pages:

Instrument database: CAMECA SAS - IMS Wf
Speciation and Toxicity: Humic Acids Increase Lead Bioavailability and Toxicity for Marine Invertebrates | EVISA's News
ESAS-CSSC: European Symposium on Analytical Spectrometry 2022 /17th Czech-Slovak Spectroscopic Conference | EVISA's Agenda of Events
Instrument database: JEOL - JAMP-9500F
Instrument database: Australian Scientific Instruments Pty. Ltd. - SHRIMP IIe and SHRIMP V
ESAS 2020: European Symposium on Atomic Spectrometry | EVISA's Agenda of Events
Instrument database: Millbrook Imstruments Limited - Millbrock MiniSIMS
Journals database: Atomic Spectroscopy
Isotopic measurements and speciation analysis | EVISA's News
ISM 2022: 8th International Symposium on Metallomics | EVISA's Agenda of Events
Instrument database: CAMECA SAS - SIMS 4550
Instrument database: Kore Technology - MS-1000 Compact Secondary Ion Time-Of-Flight Mass Spectrometer for Surface Analysis
ESAS 2014: European Symposium on Atomic Spectrometry / 15th Czech -Slovak Spectroscopic Conference | EVISA's Agenda of Events
Instrument database: CAMECA SAS - IMS 1280
All about Mass Spectrometry: Resources related to Mass Spectrometry | EVISA's News
Spectr'Atom 2022 | EVISA's Agenda of Events
Journals database: Spectroscopy (Eugene, Oreg.)
Instrument database: Physical Electronics - ADEPT-1010 D-SIMS
Books and Special Issues on Elemental Speciation (published since 2011) | EVISA's News
Instrument database: CAMECA SAS - IMS 7f / 7f-GEO