A systematic difference or systematic error between an observed value and some measure of the truth. Generally used to describe the inaccuracy of a method relative to a comparative method in a method comparison experiment. It also has a specific meaning in the statistical t-test, where bias equals the difference between the mean values of the two methods being compared or the average of all the differences between the paired sample values.

The term "bias" was found in the following pages:

Instrument database: PS Analytical - 50.043 Hg Continuous Emissions Monitor
Instrument database: JEOL - JSM-6490LV
Rapid automated arsenic speciation analysis by inductively coupled plasma mass spectrometry | EVISA's News
New Human Hair Reference Material Supporting the Biomonitoring of Methylmercury | EVISA's News
Directory of scientists: Barry Sharp
All about quality of measurements | EVISA's News
Instrument database: Fritsch GmbH - Heavy Duty Sieve Shaker analysette 18
Mercury and Autism: Is there a Link ? | EVISA's News
Link database: ASTM METHOD D5257 - Chromium, Hexavalent, in Water by Ion Chromatography
Instrument database: JEOL - JSM-6490LA
New CDC study on the effect of thimerosal exposure on neuropsychological characteristics of children is fueling the debate about the origin of autism | EVISA's News
Material database: National Institute of Standards and Technology (NIST) - SRM 2700 - Hexavalent Chromium in Contaminated Soil (Low Level)
CDC's Vaccine Safety Research is Exposed as Flawed and Falsified in Peer-Reviewed Scientific Journal | EVISA's News
Most Published Research Findings False ? | EVISA's News
Speciation matters even if the interest is in total element concentration | EVISA's News
Speciation analysis by LC-ICP-MS finds new application area in clinical chemistry: Ceruloplasmin | EVISA's News
Species transformation during speciation analysis | EVISA's News
Instrument database: Brooks Rand LLC - Modell III
Problems to be solved in the field of speciation analysis
Instrument database: Hitachi - Science & Technology - S-3400N Scanning Electron Microscope