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Instrument Database:
Hitachi - Science & Technology - S-3400N Scanning Electron Microscope
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| Year of introduction |
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| Status |
available |
| Company |
Hitachi - Science & Technology
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| Categories |
Microscopy: Electron: General
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The S-3400N has new electron optics, turbomolecular pumping, a new detector, enhanced sample handling and analysis and improved signal processing and display to ensure high quality images can be obtained from even the most difficult specimens quickly and easily.
The completely automatic beam set-up, including alignment gives crisp, sharp images under all conditions.
A new electron gun and bias gives even better low kV performance with resolution of 10 nm at 3 kV. Clean fast pumping from the turbomolecular pumping system brings rapid sample throughput.
Type I and Type II versions offer a choice of manual or motorised stages and handle samples of 200 mm diameter with thickness of up to 23 mm and 80 mm respectively. The chamber can accept EDX and WDX spectrometers simultaneously with a high imaging resolution analysis distance of just 10 mm.
A new, high sensitivity, fast response semiconductor BSD gives excellent low kV performance, with choice of Z-contrast, topography and 3-D displays. Enhanced signal mixing and processing capabilities bring greater versatility to imaging and display.
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