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Instrument Database:
JEOL - JSX-3201M Element Analyzer
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| Year of introduction |
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| Status |
available |
| Company |
JEOL
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| Categories |
X-ray spectrometer: XRF
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The JSX-3201M Element Analyzer is designed for speedy, non destructive analysis of the composition and thickness of solid, liquid, powder, and thin film samples. Integrating a high count EDS, the JSX-3201M features an outstanding level of sensitivity.
Features
- Analyzes C (carbon) to U (uranium)
- Auto sample exchanger for up to 16 samples
- Powerful X-ray source (150 kV, 3 mA, 150 W) for speedy, accurate analysis
- Digital pulse processor in EDS counter improving sensitivity (5 times higher than JEOL’s compatible models)
- DTP and SmileView programs to process spectral data, quantitative results, and image data of analytical spots
- Optional CCD for simultaneous viewing and analysis of micro area 1 mm in diameter
- Optional large specimen chamber for museum applications 460 mm × 360 mm × 150 mm
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| Specifications |
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