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Instrument Database:
JEOL - JSM-3202M Element Analyzer
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| Year of introduction |
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| Status |
available |
| Company |
JEOL
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| Categories |
X-ray spectrometer: XRF
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The JSM-3202M Element Analyzer is designed for speedy, non destructive analysis of the composition and thickness of solid, liquid, powder, and thin film samples. Integrating a high count energy dispersive fluorescent X-ray analyzer (EDS), the JSM-3202M features an outstanding level of sensitivity and covers a wide analytical range from macro to micrJSX-3202Mo areas.
Features
- Digital pulse processor in EDS counter improving sensitivity (5 times higher than JEOL’s compatible models)
- High accuracy analysis with detector featuring high energy resolution (149 eV or less)
- Powerful X-ray source (50 kV, 1 mA, 50 W) for speedy, accurate analysis
- DTP and SmileView programs to process spectral data, quantitative results, and image data of analytical spots
- Analytical areas ranging from macro (14 mm dia.) to micro (300 um dia., option)
- Optional XY stage and zoom CCD for simultaneous viewing and analysis of micro areas
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