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Instrument Database:
Kratos Analytical - High Performance X-Ray Diffractometer HPD-6000
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| Status |
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| Company |
Kratos Analytical
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| Categories |
X-ray spectrometer: XRD
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The HPD-6000 is a new high performance X-Ray Diffractometer specifically designed as a high power parallel beam system. Its large radius accepts a parallel beam polycapillary optic from XOS. This polycapillary optic, in conjunction with a secondary collimator and monochromater, generates an extremely high intensity x-ray beam for general purpose analysis. The use of parallel beam x-ray diffraction is becoming the industry standard for difficult measurements and advanced analysis. In addition to the traditional parallel beam measurements of thin films, stress and texture, the HPD-6000 also provides significantly improved performance for phase analysis, non-ambient analysis, crystallography and Rietveld.
HPD-6000 - the Ultimate in Analytical Flexibility
- Polycapillary optics & flat monochromator - high X-ray intensities
- Parallel beam X-ray geometry - ideal for general purpose analysis
- Reflection or transmission measurements via independent theta & 2theta
- Multiple sample platforms: rotation & thin film stages & sample cradles
- AII areas of diffraction space measured with constant resolution
- No defocussing: provides precise analysis of crystal orientation & stress
- Constant peak shape increases precision for crystal structure analysis
- No sample displacement: provides improved phase & nonambient analysis
- Increased beam cross section provides uniquely enhanced particle statistics
HPD-6000 Applications
- Thin Films
- (Petro) Chemicals
- Pharmaceuticals
- Ceramics & Building Materials
- Forensics & Environmental
- Glass & Cement
- Metals & Manufacturing
- Plastics, Fibers & Textiles
- Semiconductors & Electronic Materials
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