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Instrument Database:
Oxford Instruments - ED 2000
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| Year of introduction |
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| Status |
historical ( out of sale ) |
| Company |
Oxford Instruments
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| Categories |
X-ray spectrometer: XRF
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The highest resolution EDXRF analyser offers powerful performance for the rapid, elemental quantification of applications in production, research, development, environmental and forensic analysis.
You have a choice of analysis with ED2000:
- Qualitative
- rapid, elemental identification
- Semi-Quantitative
- fundamental parameters
- Quantitative
- calibrations using known standards
This instrument is easy to use, requires little or no sample preparation and its user interface can be customised via XpertEase® software. Special features of XpertEase include pre-programmed analytical parameters, full spectrometer control, data library and X-ray mathematical models.
Product Information
- resolution to 150eV
- from Na to U
- airpath, helium or vacuum
- solids, liquids, powders, granules, filter papers, films, rocks etc.
- ppm to 100%
- up to 75 elements in qualitative mode
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