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Instrument Database:
Oxford Instruments - HKL Channel 5
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No picture !!
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| Year of introduction |
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| Status |
historical ( out of sale ) |
| Company |
Oxford Instruments
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| Categories |
Microscopy: Electron: SEM
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the advanced EBSD system
Electron Backscatter diffraction (EBSD) is a powerful materials characterisation tool for the scanning electron microscope. The technique provides crystal structure and orientation information on a microscopic scale and can be used by itself or in conjunction with other techniques, such as energy dispersive X-ray analysis (EDX).
The technical expertise that is behind the HKL Channel 5 has made it the most advanced EBSD system on the market. HKL Channel 5 enables a wide range of materials analyses, including:
- Orientation mapping
- Texture analysis
- Phase identification
- Grain size analysis
- Volume fraction analysis
- Grain boundary characterisation
- Recrystallised/deformed fraction determination
HKL Channel 5 is a complete EBSD system, tailored to your needs. It includes the Nordlys II detector, forescatter detectors, plus a range of software modules for analysing and visualising your EBSD results. It is capable of the most advanced analyses, yet its modular structure enables you to select just the compenents that suit you.
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