First launched in 1994, the SX 100 is the latest generation CAMECA EPMA instrument. The central concept is a fully digitized instrument with highly integrated electronics and full automation for unattended analysis and evaluation. Comfort and ease of control are made possible by the dedicated keyboard together with the ergonomic software interface.
The tradition of superb analytical performances, based on the famous precision and reliability of the CAMECA WDS analyzers and extreme stability of the primary beam, has been continued. An uninterrupted development program has led to the introduction of new features.
Major applications are found in: geochemistry, mineralogy, geochronology, physical metallurgy, nuclear metallurgy, materials science including glass, ceramics, superconductors, cements, microelectronics, biochemistry, ...
Among the characteristic points or recent improvements and innovations:
- Choice of up to 5 WDS detectors plus one EDS detector, in parallel.
- Choice of vertical or inclined detectors for polished or rough samples.
- Continuous zoom on the optical microscope (from 250 µm to 1.7 mm field)
- Extensive new PeakSight software under PC WINDOWS 2000 environment, with specialized modules (true quantitative mapping, geochronology, Expert system, Phase analysis, Point logger, Image overlay, Particle search, Aphelion complete image processing, etc..).
- Standard Tungsten electron emitter.
- In option, LaB6 electron source with new power supply and new electron column optimized for EPMA (10keV/0.2-0.3µm).
- Choice of turbomolecular or diffusion pumps.
- 0.1 µm step size with the standard SX100 sample stage retaining high-speed travel.
- Ultra-fine beam position stability (100 nm in the long term) with beam tracking.
- New video camera for cathodoluminescence applications.
- New High Sensitivity (large) crystals for faster analysis and better detection limits.
- Increased dynamic range of BSE pre-amplifier for measurements at high beam current.
- Multicollection acquisition mode with several spectrometers measuring same line for higher sensitivity on trace elements.
