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The establishment of EVISA is funded by the EU through the Fifth Framework Programme (G7RT- CT- 2002- 05112).

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Instrument Database:

JEOL - JSM-7700F





Year of introduction
Status	available
Company	JEOL
Categories	Microscopy: Electron: General
The JSM-7700F is the only aberration (C_s and C_c) corrected SEM on the market. The JSM-7700F also offers unprecedented resolution of 0.6nm at 5kV, and dramatically extends the useful resolution of SEM technology for development of devices at the nanometer scale. It is optimized for low kV operation crucial in cross-sectional analysis of semiconductor devices. Using the JSM-7700F, the SEM operator can clearly image oxide and nitride depositions and investigate complex device characteristics with metrology. The SEM features JEOL’s patented “in-lens” backscattered electron detector technology and a Piezo-controlled, multi-sample, goniometer stage for precise, stable stage movements at the nanometer level

Events

See the complete list of deadlines!

Winter Conference on Plasma Spectrochemistry
12.01.2026
Tucson, AZ

Gordon Research Seminar: Bioinorganic Chemistry
16.01.2026
Ventura, California, United States

Gordon Research Conference: Metals in Biology
18.01.2026
Ventura, California, United States

... more Events

News

What's new on EVISA's web site ?

The European Virtual Institute for Speciation Analysis: Promoting Speciation Analysis for More Than 22 Years – Still a Necessary Activity?

New selenium compounds found in edible mushrooms

Overview of automation in speciation analysis

... more News