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The establishment of EVISA is funded by the EU through the Fifth Framework Programme (G7RT- CT- 2002- 05112).

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Instrument Database:

JEOL - JSM-7700F





Year of introduction
Status	available
Company	JEOL
Categories	Microscopy: Electron: General
The JSM-7700F is the only aberration (C_s and C_c) corrected SEM on the market. The JSM-7700F also offers unprecedented resolution of 0.6nm at 5kV, and dramatically extends the useful resolution of SEM technology for development of devices at the nanometer scale. It is optimized for low kV operation crucial in cross-sectional analysis of semiconductor devices. Using the JSM-7700F, the SEM operator can clearly image oxide and nitride depositions and investigate complex device characteristics with metrology. The SEM features JEOL’s patented “in-lens” backscattered electron detector technology and a Piezo-controlled, multi-sample, goniometer stage for precise, stable stage movements at the nanometer level

Events

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EMEC 24: European Meeting on Environmental Chemistry
26.11.2024
Alicante, Spain

23rd ICFIA: International Conference on Flow Injection Analysis and FRelated Techniques
03.12.2024
The Empress Hotel, Mueang, Chiang Mai, Thailand

PittCon 2025
01.03.2025
Boston, Massachusetts

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News

What's new on EVISA's web site ?

Liquid chromatography hyphenated with inductively coupled plasma optical emission spectrometry (LC-ICP-OES) for speciation analysis

Mercury-Contaminated Tuna: An Unprecedented Health Scandal

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