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Instrument Database:
Shimadzu Europe - GCMS-QP2050
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| Year of introduction |
2024 |
| Status |
available |
| Company |
Shimadzu Europe
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| Categories |
Mass spectrometer: GC-MS
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The business environments and needs involved in analysis work change on a continual basis. The next-generation GCMS-QP2050 gas chromatograph mass spectrometer, with its accumulation of impressive Shimadzu technology, will lead the way forward. New value is provided by hardware boasting astounding reliability and stability, and easy-to-operate software equipped with superior automated technology.
Minimum Maintenance, Maximum Progress
Revolutionary Platform Makes Maximum Progress
The conventional platform has significantly evolved to include the DuraEase ion source, designed in pursuit of high durability and ease of maintenance. Plus, an incomparable combination of stability and speed enables unmatched instrument uptime for maximum productivity and a faster return on investment.
Detector
The new model is equipped with both the latest noise suppression technology and high amplification performance, and can accurately assess even trace ions.
Quadrupole rods
By significantly improving mass separation performance and ion transmittance, the system achieves the industry's highest level of scan speed (30,000 u/sec). Further, the new quadrupole rod is equipped
with a pre-rod, so it is maintenance-free.
Interface
In order to suppress the adsorption of high boiling point components, the new interface has been optimized to ensure a uniform temperature distribution.
DuraEase* ion source
DuraEase technology enables this next-generation ion source to achieve the industry's highest level of sensitivity, durability, and ease of maintenance.
Long-life filament
The highly durable new filament has an operating life about five times longer than usual.
High Durability in Consecutive Analyses
The GCMS-QP2050, which boasts incomparable robustness, achieves extremely stable measurements, even during consecutive analyses of VOCs in water, by eliminating the effects of elution of the column bleed to the utmost limit.
Simple Operation, Confident Results
Ion Source Maintenance Takes Just One Minute
With the DuraEase ion source, the conventional ion source structure has been completely revised, in pursuit of more convenient maintenance. The ion source is disposable and no cleaning is required, so maintenance is finished in just one minute.
One-Touch GC Inlet Maintenance
The instrument is equipped as standard with a ClickTek™ nut, enabling the GC injection port to be attached or detached simply by manipulating a lever by hand, without tools.
Easy Startup and Shutdown from the Touch Panel
The vacuum system can be turned ON/OFF and Easy sTop* can be performed from the GC touch panel. Operations from a personal computer are not required, so maintenance of the GC injection port, column, and ion source can proceed with ease.
* This function guides the user through the replacement of the GC injection port septum and glass insert without turning OFF the vacuum system.
Anyone can Achieve Analysis Results
Examination of the analytical conditions is indispensable for acquiring better data. The GCMS-QP2050 reduces the burden of examining these conditions, allowing even novice users to acquire data on par with an experienced operator.
Easily Analyze a Wide Range of Applications
With the completely new ion source and detector, the system is more than capable of detecting even trace compounds. The new interface, which minimizes the production of cold spots, enables the acquisition of favorable peak shapes and sensitivity, even for compounds prone to adsorption.
Ultra Fast Scanning Technology Supports Accurate Measurements
Advances to Shimadzu’s impressive high-speed scan technology result in the industry's highest level of 30,000 u/sec. As a result, sensitivity on par with SIM analysis can be obtained even with FASST*1. In addition, Advanced Scanning Speed Protocol (ASSP™*2) minimizes sensitivity loss, even when the Scan measurement range is widened, enabling accurate qualitative analysis.
*1 Fast Automated Scan/SIM Type: In this measurement mode, switching rapidly between Scan mode and SIM mode enables high-sensitivity SIM analysis and Scan analysis for component confirmation to be performed simultaneously in a single analysis.
*2 By automatically optimizing the rod bias voltage during high-speed scans, this control technology minimizes sensitivity drops during high-speed scans.
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