The JEM-3000F Field Emission Microscope obtains the highest image quality and analytical performance in the 300kV class analytical TEM. Employing a field emission gun offering high brightness, high coherency and narrow energy spread, a probe current of about 0.5 nA can be obtained with a probe diameter of 1nm. The JEM-3000F offers other advanced features such as a microactive goniometer with motorized 5 axes, a directly coupled ion pump with a bake out function for clean specimen environments, quick beam select, and computer controlled data management and storage.
