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Instrument Database:
Leco Inc. - SA-2000 Surface analyzer
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| Year of introduction |
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available |
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Leco Inc.
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| Categories |
Spectrometer ( Atom. ): AES: GD-AES
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This
SA-2000 surface analyzer brings the advanced capabilities of atomic emission spectroscopy
to the production control environment for quantitative depth profiling. The SA-2000 is
designed for determining the composition of conductive and non-conductive materials as a
function of depth with a measurement range to 500 microns (best at 10 nm to 50 microns).
It is an extremely user-friendly system and its software is hosted in a Microsoft® Windows® environment. Ideal
for the analysis of surface-treated materials, it will perform bulk (24 elements nominal)
as well as quantitative depth profile analysis.
Now available with RF-only option .
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| Specifications |
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