|
Instrument Database:
JEOL - JSPM-4500 Scanning Probe Microscope
| |
|
|
| |
|
| |
|
| Year of introduction |
|
| Status |
available |
| Company |
JEOL
|
| Categories |
Surface Analysis: Auger
|
|
The
JSPM-4500 UHV SPM is designed for the high resolution study of
surfaces. This instrument is available as individual components
for labs that already have a suitable vacuum chamber or as a complete
system including vacuum system. The complete package offers both
a chamber for sample preparation and modification and a chamber
for imaging. Additional chambers can be added to accommodate additional
sample preparation and analysis. Atomic scale imaging with both
AFM and STM modes is available. Variable temperature options allow
imaging with sample temperatures from less than 20K to above 1500K.
STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes
include contact, friction force microscopy, current image, non-contact
and discrete contact with frequency detection, and phase imaging.
|
| Specifications |
|
|
|
|
