|
Instrument Database:
JEOL - JSPM-5200 Environmental Scanning Probe Microscope
| |
|
|
| |
|
| |
|
| Year of introduction |
|
| Status |
available |
| Company |
JEOL
|
| Categories |
Microscopy: SPM
|
|
The
JSPM-5200 is a multipurpose, high resolution SPM offering ease of
use with diverse measurement and sample environments. The JSPM-5200
can be used in various native environments -- from ambient air,
controlled atmosphere, fluid, or vacuum, with the sample heated
to 500° C (773K) or cooled to -143° C (130K). The JSPM-5200
can also perform a wide range of applied measurements including
the combination of image signals and instantaneous switching between
operation modes. The open architecture of the JSPM-5200 provides
multiple access ports and easy access to the probe. The JSPM-5200
can be configured as either an atomic force microscope (AFM) or
scanning tunneling microscope (STM) by merely changing the tip.
STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include
contact, friction force microscopy, current image, non-contact and
discrete contact with either slope detection or frequency detection,
and phase imaging. A patented drift-free stage is implemented to
provide an extremely stable imaging platform.
|
| Specifications |
|
|
|
|
