|
Instrument Database:
JEOL - JSPM-5400 Scanning Probe Microscope
| |
|
|
| |
|
| |
|
| Year of introduction |
|
| Status |
available |
| Company |
JEOL
|
| Categories |
Microscopy: SPM
|
The JSPM-5400 is a powerful and versatile scanning probe microscope that is also easy-to-use. The JSPM-5400 offers high-speed, non-damaging scan control, simple positioning, high resolution imaging, and stable observation of heated/cooled samples in high vacuum.
The JSPM-5400 patented, non-contact AFM, utilizes a constant excitation amplitude FM detection method (JEOL patent) which enables high-accuracy surface-potential imaging as well as high resolution imaging in a vacuum, the result of which is no air resistance and no adsorption of impurities on sample surfaces decreases.
JSPM-5400
Features:
- detection enables high resolution atomic imaging in vacuum
- High speed, non damaging cantilever for higher throughput
- Automatic vertical drift correction due to temperature change
- Full range of optional accessories available including:
- Airlock specimen exchange
- Liquid nitrogen cold trap for high vacuum (10-6 Pa order)
- Sample heating/cooling devices
|
| Specifications |
|
|
|
|
