|
Instrument Database:
Bruker AXS GmbH - D8 DISCOVER
| |
|
|
| |
|
| |
|
| Year of introduction |
|
| Status |
available |
| Company |
Bruker AXS GmbH
|
| Categories |
X-ray spectrometer: XRD
|
The D8 DISCOVER brings innovative Thin Film Solutions from the forefront of research to quality control, product and process development.
Based on the D8 platform with reliable mechanics and ergonomic design the D8 DISCOVER includes a whole set of unique advantages:
- Third generation Göbel Mirrors providing the x-ray highest flux density – essential for all thin film applications.
- The entire system is designed for easy and failsafe operation. Tools like the motorized absorber allow fully automatic operation without user intervetion.
- High performance optics are selected and exchanged to provide the optimum resolution for each application and sample.
- Optimal sample handling takes advantage of the new UMC stages as well as different types of Eulerian cradles for e.g. residual stress, texture, micro-diffraction investigations. For x-ray reflectometry on coatings or semiconductors dedicated stages allow even temperature studies.
- Shortest measurement times are achieved using Ultra GID for nanometer layers and the VANTEC-1 detector for reciprocal space maps.
- XRD Wizard and XRD Commander support the user in the most intuitive creation of comprehensive measurements; intelligent scripts take care of the routine work. The evaluation programs LEPTOS and MULTEX Area guarantee that you stay on the forefront of science.
|
|
