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The establishment of EVISA is funded by the EU through the Fifth Framework Programme (G7RT- CT- 2002- 05112).


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Instrument Database:

Carl Zeiss AG - ULTRA 55

Year of introduction
Status historical ( out of sale )
Company Carl Zeiss AG
Categories Microscopy: Electron: SEM: FE
The ULTRA 55 represents the latest development in GEMINI® technology. Based on the SUPRA™ 55, the ULTRA 55 now comprises a fully integrated Energy and angle selective Backscattered electron (EsB) detector. The ULTRA 55 offers ultra high resolution for both SE to image surface information and BSE to present compositional information. The new EsB detector features an integrated filtering grid to enhance image quality and requires no additional adjustments. The EsB detector is less sensitive for edge contrast and charging effects which enables precise imaging and measurement of boundaries, particles, and features.
Combined with the large multi-port analytical chamber, the fully motorised 5-axes motorised eucentric stage and the GEMINI® high current mode the ULTRA 55 also offers superb analytical capabilities.

Key Features
  • Ultra high resolution imaging at low kV
  • Ideal for precise boundary, feature, and particle measurements
  • High efficiency EsB detector for compositional information
  • High efficiency In-lens SE detector for high contrast surface imaging
  • BSE imaging at very short working distances - 1mm WD
  • Ultra stable high current mode for X-ray analysis and EBSD applications - 20 nA / 0.2%/h
  • Large five axes motorised eucentric stage
  • Easy operation through Windows® XP based SmartSEM™ control software 
Specifications
Resolution    
1.0 nm @ 15 kV
1.7 nm @ 1 kV
4.0 nm @ 0.1kV

Magnification    
12 - 900,000x in SE mode
100 - 900,000x with EsB detector

Emitter    
Thermal field emission type, stability >0.2%/h

Acceleration Voltage    
0.1 - 30 kV

Probe Current    
4 pA - 10 nA (20 nA optional)

Standard Detectors    
EsB detector with filtering grid
Filtering grid voltage 0 - 1500 V
High efficiency In-lens SE detector
Everhart-Thornley Secondary Electron Detector

Chamber    
330 mm (Ø) x 270 mm (h)
2 EDS ports 35° TOA
CCD-camera with IR illumination

5-Axes Motorised Eucentric Specimen Stage    
X = 130 mm
Y = 130 mm
Z = 50 mm
T = -3 - 70°
R = 360° (continuous)

Image Processing    
Resolution: Up to 3072 x 2304 pixel
Noise reduction: Seven integration and averaging modes

Image Display    
Single flicker-free 19" XVGA monitor with SEM image displayed at 1024 x 768 pixel
TFT optionally available

Image Hardcopy    
Choice of Windows® driven laser, inkjet or video print media

System Control    
SmartSEM™* with Windows® XP, operated by mouse, keyboard and joystick with optional control panel





Events
See the complete list of deadlines!
EMEC 24: European Meeting on Environmental Chemistry
26.11.2024
Alicante, Spain
23rd ICFIA: International Conference on Flow Injection Analysis and FRelated Techniques
03.12.2024
The Empress Hotel, Mueang, Chiang Mai, Thailand
PittCon 2025
01.03.2025
Boston, Massachusetts
... more Events
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