JEOL 100 CX-II Scanning-Transmission Electron Microscopy (STEM). The TEMSCAN 100CX-II is a high performance combined electron microscope consisting of the 100CX-II TEM and a scanning attachment of ASID-4D; it has a magnification range for the TEM mode of 360X to 320,000X and 10X to 200,000X for the SEM mode, with a resolution of 2nm or better.