The Philips/FEI Technai 20 (FEI Co., Eindhoven, Netherlands) is a 200 kV TEM. Aside from normal viewing of specimens in brightfield, dark field or electron diffraction mode, the Technai 20 has scanning transmission capabilities for studying specimen-induced contrast, an energy dispersive X-ray detector and analyzer for elemental analysis. Stereocopic imaging for 3-dimensional viewing of specimens is easily obtained using the rotatable double tilt specimen holder.