Instrument Database:
Hitachi - Science & Technology - S-3000H Scanning Electron Microscopy
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Year of introduction |
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Status |
available |
Company |
Hitachi - Science & Technology
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Categories |
Microscopy: Electron: General |
The S-3000H can accommodate specimens up to 150 mm in diameter, and offers a choice of specimen stages including eucentric, Cartesian, tensile and cryogenic versions for a wide range of applications. A host of automatic functions are complemented by a resolution of 3.5 nm resolution.
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