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Instrument Database:
Hitachi - Science & Technology - S-4800 FESEM
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| Year of introduction |
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| Status |
available |
| Company |
Hitachi - Science & Technology
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| Categories |
Microscopy: Electron: General
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The S-4800 combines the resolution capabilities normally associated with the S-5200 in-lens microscope with the sample handling of more conventional FESEMs.This outstanding performance is achieved through a new objective lens design and enhanced E X B filter technology to collect and separate the various signals giving topographical and compositional information. This new electron optical arrangement also allows the instrument to offer superb resolution figures of 1.0 nm at 15 kV and 2.0 nm at 1 kV.
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