Seiko Instruments Inc. - SEA5100A, SEA5100/5200 Series Micro Element Monitor

Overview
SEA5100/5200 series is XRF element monitor for qualitative analysis and simultaneous quantitative analysis of various elements in 50 µm level area. Type A, equipped with X-ray filter, is capable of measuring such hazardous substances as Cd and Pb restricted by WEEE & RoHS directives with high sensitivity. A CCD microscope and XYZ automatic stage are equipped, enabling analysis of submicroscopic area and display and print a mapping image of measured concentration of element. Also, it is equipped with functions such as extraneous substance checking and coating thickness measurement.

Features

• Standard equipped with round 0.1mm collimator making analysis of microscopic areas possible (minimum 25 µm)
• Equipped with high resolution semiconductor detector and X-ray filter (Type A), making analysis and coating thickness measurement with high resolution and high accuracy at few ppm level possible.
• Continuous measurement of designated point, as well as line analysis and mapping enabled using the CCD Camera and automatic stage
• Can compare two spectrums, allowing easy extraneous substance analysis
• Type A is standard equipped with sample shape and thickness correction function that is essential for analysis of hazardous substance in plastic.
• Model SEA5200 with large sample chamber that accepts pots and large board also available
• Creates reports easily with single click operation.