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Instrument Database:
Seiko Instruments Inc. - SFT9100 Series Fluorescent X-ray Coating Thickness Gauge
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| Year of introduction |
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| Status |
historical ( out of sale ) |
| Company |
Seiko Instruments Inc.
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| Categories |
X-ray spectrometer: XRF
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OverviewA coating thickness gauge that uses fluorescent X-rays, this device performs highly accurate measurements of metal films using plating, deposition, sputtering, ion plating etc. Installation of new functions makes operating the instrument easier than ever. Features- Simple operation
- Easy focus operation with the laser focus mechanism
- Collision prevention sensor makes contoured samples safe to use
- Focus distance toggle mechanism enables measurement of low area in samples with height
- Slit-type large sample chamber allows measurements from mechanical parts to print boards all on one instrument
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