Robust, High Sensitivity FT-IR System for Education and Routine Analysis
Higher Signal-to-Noise Ratio than Competitive Systems
Easy, Single Step Analysis and Data Processing
IR Imaging with Multichannel Microscope and Rapid Scan Option
Max resolution: 0.9 cm-1
S/N ratio: 22,000:1
The new Jasco FT/IR-4100 is designed to provide operational features and sensitivity levels found only in more expensive instruments. The innovative technology incorporated in these instrument results in exceptionally high signal-to-noise ratio specifications. The model offers exceptional flexibility and can be easily upgraded to meet new requirements. Optional expandability includes microanalysis with an IR microscope, IR imaging with a multichannel microscope, and rapid scan option. The Jasco Quick Start System enables users of all experience levels to measure samples and perform data processing functions quickly and easily with a simple push of a button.
The FT/IR-4100 offers the most cost effective choice for a variety of IR applications. It is rugged and reliable with all of the features required in a general purpose instrument.