|
Instrument Database:
Applied Spectra - J200 Tandem LIBS-LA Instrument
| |
|
|
| |
|
| |
|
| Year of introduction |
2012 |
| Status |
available |
| Company |
Applied Spectra
|
| Categories |
Spectrometer ( Atom. ): AES: LIBS
|
Applied Spectra's J200 Tandem LA—LIBS instrument is a truly groundbreaking advance in laser ablation analytical instrumentation. It performs simultaneous LIBS and LA-ICP-MS measurements. By capturing the emitted light from a laser ablation plasma, the J200 performs rapid spectroscopic analysis while transporting ablated particles to an ICP-MS instrument with high transport efficiency.
This revolutionary analytical technique enables exciting new measurement possibilities: analysis of organic and lighter elements, rapid elemental mapping, normalization of ICP-MS signal with plasma emission, and simultaneous measurement of major/trace elements and isotopes.
The J200 inherits its proven LA system design and powerful LIBS technology from Applied Spectra's trusted line of state-of-the-art products, including our J100 Series Femto LA system plus our RT100 Series LIBS instruments. By eliminating the cost of gas and laser beam delivery optics replacement, the J200 drives down the cost of ownership while providing outstanding analytical capabilities.
J200 Feature Summary
- Proven and reliable laser source
- Highly rugged, short pulse Nd:YAG laser with wavelength down to 213 nm
- High rep rate Yb diode pumped laser source for femtosecond laser ablation upgrade
- Innovative modular system design for standalone LA, LIBS, or tandem LA—LIBS configuration
- Dual video cameras for easy navigation and crisp detailed imaging of sample
- Applied Spectra's Flex sample chamber to optimize transport gas flow and particle washout performance
- Axiom LA system software, including:
- Full control of hardware components and measurement automation
- Powerful data analytics module for LIBS and LA-ICP-MS analysis
- LIBS Chemometric software for discriminatory and classification nalysis
- Deployment of versatile sampling methods: bulk analysis, micro-spot & inclusion analysis, depth profiling, and elemental mapping
- Low maintenance cost
- Femtosecond LA upgrade path
- LA/LIBS application support from the experts at Applied Spectra
|
|
