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Instrument Database:
Bruker Nano GmbH - S4 TStar - Benchtop TXRF Spectrometer
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| Year of introduction |
2016 |
| Status |
available |
| Company |
Bruker Nano GmbH
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| Categories |
X-ray spectrometer: TRXRF
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Total reflection X-ray fluorescence (TXRF) spectroscopy is a well-established method for trace element analysis of a variety of samples. The S4 TStar simplifies TXRF for 24/7 routine operation with guaranteed data quality. Significant improvements of detection limits are accompanied by automatic QC procedures, useful software routines and a unique versatility in terms of sample types and carriers. - The benchtop TXRF spectrometer S4 TStar offers lowest detection limits in the sub-ppb range.
- Automatic quality control features provide confidence in data and instrument quality.
- Maximum versatility for a direct analysis of many types of samples on different carriers.
- Optimized for 24/7 operation in industrial routine analysis.
- Designed for multi-user operation with a high capacity of 90 samples.
- A selection of sample trays and other tools accelerates sample preparation and minimizes errors and contamination risks
- S4 TStar is a powerful tool for food fraud prevention in globalized supply chains; e.g. food safety according to FAO/WHO standards realized by direct analysis of low levels of As in rice.
- S4 TStar monitors catalyzer elements in pharmaceutical production according to upcoming US and EU Pharmacopeia guidelines; e.g. detection of sub-ppm catalyzer elements in active pharmaceutical ingredients (API) and additives.
- S4 TStar provides a versatile solution for water, effluent, air and soil analysis for the recovery of a healthy environment; e.g. environmental monitoring by direct measurement of contaminants in wastewater, slurries and effluents in the low ppb range.
The S4 TStar is a very versatile tool for the analysis of a great variety of sample types on different reflective carriers. This puts it ahead of ICP, which requires fully dissolved liquid samples. |
| Specifications |
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Element range
| Mo excitation: Al to U (with exception of Nb to Ru)
W excitation: K to U
| Concentration
| ppb to 100 %
| Detection limit
| <1 pg nickel
| Sample types
| Liquids, suspensions, powders, particles, metals, thin layers,
tissues, wafers, filters etc.
| | Sample volume | Liquids and suspensions from 1 μl to 50 μl
Particles up to 100 μm in diameter, powders up to 10 μg | Sample changer
| Automatic sample changer for 10 trays
Automatic tray detection for sample type identification
| Capacity
| Sample tray 1: 30 mm discs, max. 90 discs
Sample tray 2: microscopy slides, max. 30 slides
Sample tray 3: 2” wafers, max. 50 wafers
Sample tray 4: rectangular, <54 mm, max. 50 samples
Sample tray 5: user defined
| X-ray tube
| max. 50 W metal-ceramic, max. 50 kV, 1 mA, air-cooled | X-ray optics
| Multilayer monochromator | Excitation modes
| Mo-K, 17.5 keV
W-Brems, 35 keV; W-L, 8.4 keV
Cu-K, 8.0 keV
Cr-K, 5.4 ke
| Detector
| Peltier-cooled XFlash® silicon drift detector
Liquid nitrogen is not required
60 mm2 active area, optional: 100 mm2 active area
| Energy resolution
| <149 eV at 100 kcps (Mn Ka)
| Interface
| Data exchange by TCP/IP (RJ45 cable) | Mains
| 100/240 V, 50/60 Hz
| Size
| 528 mm x 693 mm x 512 mm (height x width x depth)
| Weight
| 80 kg
| Accessories
| Washing cassette for sample carriers, storage boxes,
Starter set for TXRF (pipettes, tips, tubes, mortar, spatula)
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