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Instrument Database:
HORIBA Jobin Yvon - GD PROFILER HR
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| Year of introduction |
2003 |
| Status |
available |
| Company |
HORIBA Jobin Yvon
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| Categories |
Spectrometer ( Atom. ): AES: GD-AES
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This instrument is dedicated to the surface, depth profile and bulk analysis of almost any material or coating - conductive or non-conductive. It can simultaneously analyze up to 64 elements including the gasses H, O, N and Cl. It features the highest optical resolution available with a 1 m polychromator and an optional 1 m monochromator, making it the instrument of choice for complex matrices such as Zr, W, U, or demanding research. The instrument uses only a primary vacuum thereby simplifying the analysis. Its sputtering rate is extremely fast (µm/min range) and its depth resolution can be as good as a nanometer. The GD-PROFILER HR™ is equipped with the patented HDD® (high dynamic) detectors that provide 10 decades of dynamic range and the CenterLite™ system for precise positioning of the sample in front of the lamp. - RF-Only generator is Class E standard and optimized for stability and crater shape allowing for real surface analysis.
- JY original, ion-etched holographic gratings assure the highest light throughput for maximum light efficiency and sensitivity.
- Patented HDD® detection provides speed and sensitivity in detection without compromise.
- Easily accessible sample compartment allows plenty of room for sample loading.
- Powerful QUANTUM™ XP™ software with Tabler report writing tool.
- CenterLite laser pointer (patent pending) for precise sample loading.
- Monochromator option available only from JY provides perfect tool to increase instrument flexibility while adding "n+1" capability.
- GD-PROFILER HR™ offers 1.0m focal length providing optical resolution of 14pm with simultaneous analysis of up to 60 channels.
- Optional 1.0m monochromator of the GD-PROFILER HR™ offers the highest optical resolution available of 9pm in the UV.
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