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Instrument Database:
Hitachi - Science & Technology - HD-2300 STEM
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| Year of introduction |
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| Status |
available |
| Company |
Hitachi - Science & Technology
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| Categories |
Microscopy: Electron: General
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The HD-2300 STEM is designed for thin film evaluation and has exceptional analytical capabilities.
The PC-controlled instrument has a Schottky-type field emission electron source and offers a resolution 0.204 nm. at an accelerating voltage of 200 kV. With phase contrast and Z-contrast imaging capabilities as standard, an optional nano area live diffraction imaging unit allows simultaneous observation of diffraction and Z-contrast images.
Analysis options include EDX and electron energy loss spectrometry. The latter allows real time element mapping with 2 nm spatial resolution. An optional drift compensation unit allows EDX X-ray mapping to be conducted over periods up to 8 hours with no image drift
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