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Instrument Database:
Hitachi - Science & Technology - S-4300SE/N Field Emission Variable Pressure SEM
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| Year of introduction |
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| Status |
available |
| Company |
Hitachi - Science & Technology
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| Categories |
Microscopy: Electron: General |
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The S-4300SE/N brings the resolution capabilities of the high brightness field-emission electron gun to variable pressure scanning electron microscopy. The wide operating pressure range of 10 - 1000 Pa allows examination of an even wider range of wet, oily or nonconductive samples. Outstanding resolution at low accelerating voltages and excellent sample handling capabilities combine performance with versatility.
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