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Instrument Database:
Hitachi - Science & Technology - S-5200 In Lens FESEM
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| Year of introduction |
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| Status |
available |
| Company |
Hitachi - Science & Technology
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| Categories |
Microscopy: Electron: General
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The S-5200 In-Lens FESEM Series can deliver an incredible 0.5 nm resolution at 30 kV and 1.8 nm at 1 kV to give outstanding image quality. The microscope is capable of accepting specimens 9.5 x 4 x 4 mm on its computer controlled side entry stage. An EDX system may also be fitted.
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