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Instrument Database:
Hitachi - Science & Technology - S-5500 In Lens FESEM
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| Year of introduction |
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| Status |
available |
| Company |
Hitachi - Science & Technology
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| Categories |
Microscopy: Electron: General
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The S-5500 FESEM offers outstanding levels of resolution across the entire accelerating voltage range with resolutions of 0.4 nm at 30 kV and 1.6 nm at 1 kV. The in-lens configuration is also fully compatible with EDX detectors. EDX analysis and imaging can be carried out without changing specimen position. An intelligent graphical user interface has been combined with a large LCD monitor to enable outstanding, high quality images to be produced quickly and easily. A simple mode selection makes it easy to switch between high resolution imaging and EDX analysis operating conditions.
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