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The establishment of EVISA is funded by the EU through the Fifth Framework Programme (G7RT- CT- 2002- 05112).


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Instrument Database:

JEOL - JEM-200 CX

Year of introduction
Status historical ( out of sale )
Company JEOL
Categories Microscopy: Electron: TEM
The JEM-200 CX is a high performance transmission electron microscope. The basic instrument is expanded with two additional extensions namely a scanning attachment and a energy dispersive X-ray spectrometer, thus enabling the operator to perform a wide range of measurements.
Start-up, shutdown and photography can be executed by a simple pushbutton operation. Magnification and camera length can by directly read out regardless of any change in the accelerating voltage, and recorded together with the film number on the film. The focus, once set, almost never requires readjustment because it compensates for change in the accelerating voltage and magnification. However, if required, correct focussing can be obtained using an image wobbler device. Moreover, this microscope provides very stable and excellent bright field - as well as dark field images at low to high magnifications and a variety of electron diffraction patters instantly.
Specifications
Microscope
 Guaranteed resolution0.14 nm lattice
0.35 nm point to point
 Accelerating voltage80, 100, 120, 160, 200 kV
 Magnification
 Standard
Selected area
Low magnification		600 x - 450000 x
6000 x - 120000 x
100 x - 600 x
 Electron diffraction camera length
 Selected area
High dispersion
High resolution		160 - 2330 mm
3.4 - 55 mm
312 mm
 Thermionic electron gun, pre-centred tungsten hairpin filament
 Apertures
 Condenser lens
Objective lens
Field limiting		20, 200, 300, 400 µm
20, 40, 60, 120 µm
20, 80, 250, 1000 µm
 Specimen
 Diameter3 mm
 StageX and Y direction 1 mm
Z direction 0.5 mm
 Holderssingle tilt holder
double tilt holder
tilt-rotation holder
Be-double tilt holder
Scanning attachment EM-ASID 3D Jeol
 Resolution
 STEM image
SEM image		0.25 nm
0.40 nm
 Magnification
 STEM
SEM		 300 x - 800000 x
10 x - 800000 x
 Detectors secondary electron detector
transmitted electron detector
back-scattered electron detector
EDS X-ray spectrometer
 Be-window
 Diameter
Resolution FWHM		10 mm
141 eV





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