|
Instrument Database:
Kratos Analytical - Axis Ultra
| |
|
|
| |
|
| |
|
| Year of introduction |
|
| Status |
available |
| Company |
Kratos Analytical
|
| Categories |
Surface Analysis: ESCA/XPS
|
AXIS ULTRA, the established market leader in imaging and small spot XPS, now comes equipped with the next generation of photoelectron detector. The system incorporates quantitative, real time parallel imaging with the highest resolution spectroscopy over all analysis areas.
Multiple options offer highest flexibility for Scanning Auger Micrcoscopy (SAM), Ion Scattering Spectroscopy (ISS) Quadrupole Secondary Ion Mass Spectrometry (SIMS) and Ultraviolet Photoelectron Spectroscopy (UPS), making Ultra DLD the system of choice for the widest range of research and routine analytical applications.
The AXIS Ultra DLD integrates the Kratos patented magnetic immersion lens and charge neutralisation system with the spherical mirror and concentric hemispherical analysers. Combined with the newly developed delay-line detector (DLD) for both imaging and spectroscopy the AXIS Ultra DLD is the very best spectrometer for analysts requiring unsurpassed performance.
The hemispherical analyser provides both high energy resolution and high sensitivity spectroscopic performance. Exceptional small spot capabilities (<15µm) ar achieved via a series af selected area apertures used in combination with the magnetic and electrostatic lenses. In parallel imaging mode photoelectrons are transferred to the patented spherical mirror analyser which produces real time chemical state images with better than 3µm spatial resolution.
The delay-line detector, comprising a multi-channel plate stack above a delay-line anode, is used for photoelectron detection in both spectroscopy and imaging mode With over 100 detector channels the DLD can also be use to acquire unscanned or 'snapshot' small spot spectra in a matter of seconds. Genuine pulse counting in 2D imaging mode means that quantitative parallel images can now be generated allowing greater insight into the lateral distribution of chemical species at the surface.
|
| Specifications |
|
|
|
|
