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Instrument Database:
Kratos Analytical - X-Ray Diffractometer XRD-6000
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| Year of introduction |
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| Status |
available |
| Company |
Kratos Analytical
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| Categories |
X-ray spectrometer: XRD
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The XRD-6000 offers powerful solutions for today's analytical problems, encompassing routine qualitative and quantitative phase analysis to crystallography. With fully integrated 32 bit Windows 95 software offering custom solutions for many of the more common solid phase analyses, such as free silica, retained austinite, and rutile/anatase, the XRD-6000 brings ease of use to a new level. As your analysis needs change and expand, the XRD-6000 will meet your developing requirements with a full range of attachments for microstructure determinations including residual stress, non ambient chambers, transmission/reflection, fiber/polymer orientation, crystallite size/strain and percent crystallinty (please contact us for a current list of attachments).
The XRD-6000 has set the new price/performance benchmark in x-ray diffraction.
With its inherent ease of use and modular expandability, you can be confident that the XRD-6000 will meet your analysis needs today and tomorrow at a cost of ownership that might pleasantly surprise you!
Research & QC Functionality
- Crystalline Phase Identification
- Crystalline Phase Quantification
- Solid Solution Quantification
- Crystal Structure Analysis
- Crystallite Size & Microstrain
- Percentage Crystallinity
- Thin Film Analysis
- Fibre & Polymer Orientation
- Residual Stress Analysis
- Non-ambient Analysis
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