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Instrument Database:
Oxford Instruments - INCAEnergy TEM
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| Year of introduction |
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| Status |
historical ( out of sale ) |
| Company |
Oxford Instruments
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| Categories |
Microscopy: Electron: TEM
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EDS microanalysis system for TEM
Oxford Instruments recognises the challenges of X-ray microanalysis in the TEM and has designed the INCAEnergyTEM EDS System to meet and overcome these challenges. The INCAEnergyTEM system includes EDS detection hardware specifically designed to maximise X-ray collection, without compromising spectrum purity, low energy performance and protection from high signal flux.
Reasons that INCAEnergyTEM is the system of choice for so many TEM and STEM users include:
System Basics:
- The INCA EnergyTEM user interface ensures the data you require will be obtained accurately and quickly
- The INCA EDS hardware is specifically designed to work in the TEM. The INCAx-sight detector offers excellent resolution at all energies, high collection efficiency, no spectrum artefacts and a shutter to minimise time lost by sudden signal increases paralysing the counting chain
- The INCA encyclopaedia and help functions are designed at the centre of the system to provide real peace of mind
- INCA EnergyTEM makes reliable element identification easy with accurate AutoID.
- Accurate determination of element composition using the Cliff –Lorimer thin sample approach, including density/film thickness corrections
- Keyboard control of start, stop and resume spectrum acquisition functions
- Automatic spectrum termination on a window integral for optimum detection of trace elements
- INCA EnergyTEM has been designed with data review in mind, with easy archiving, reporting and exporting
- Extended Kv range 0.40 Kv, with a 1K or 2K channel range
System Options:
- Semi-STEM provides X-ray mapping capability for many TEMs which do not have a STEM unit
- All X-ray mapping and linescanning applications in one easy tool. SmartMapTM provides a spectrum image* datacube which acts as a virtual sample for future detailed analysis
- Variable dwell times for X-ray mapping and linescanning allowing long time/ single frame acquisition
- Cameo+ shows you what the sample would look like if your eyes could see X-rays, enabling phase distribution to be quickly and reproducibly determined*
- Point & ID+ for image centric analysis for analysing materials where spatial information is important+
- Phase Map for phase identification and analysis that does not require extended data acquisition times
- Lines and Grids for the investigation of linear variations across a sample+
- Spectrum Match for when you want to know if you have seen a material before
- SiteLock for automatic compensation for image and sample drift, which is particularly important when studying chemistry on the nano-scale
Requires a STEM unit or Semi-STEM
Requires a STEM unit
INCAEnergyTEM- the power in EDS, is part of the revolutionary INCA platform:
- EDS-WDS-EBSD on one platform
- Secure automatic data structure
- Clear simple processes
- On-line help and tutorials
- Interactive error checking
- Customer quality reports
Product Information
- Energy dispersive X-ray microanalysis on a TEM using the INCA x-sight EDS detector and INCA x-stream digital pulse processor
- Detector technology designed to meet the challenges of microanalysis in the TEM (high spectral purity, good solid angle, good performance at all energies, shutter protection)
- Qualitative and quantitative analysis you can depend on, (accurate AutoID, spectrum overlay, Cliff-Lorimor algorithm)
- Easy Phase Discrimination (SmartMap, Cameo+ and PhaseMap)
- Reliable solution to image and sample drift (SiteLockTM)
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