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Instrument Database:
Oxford Instruments - X-Strata960
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| Year of introduction |
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| Status |
historical ( out of sale ) |
| Company |
Oxford Instruments
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| Categories |
X-ray spectrometer: XRF
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XRF for measurement of coating thickness and material composition
The X-Strata960 builds upon the solid foundations established by the CMI900 series The new design includes:
- New 100 watt X-ray tube is the most powerful tube available – 30% increase in precision at the same measurement/50% decrease in measurement time at the same precision.
- Smaller X-ray spot size – Measure even smaller features in electronic components with the new 15µm collimator. Offers improved CCD camera and zoom stage and high precision Y Stage.
- Distance Independent Measuring (DIM) – More flexibility to measure oddly shaped samples – sample surface can be measured anywhere within the DIM range 12.5-90mm (0.5”-3.5”) with a total Z travel of 230mm (9"). Offers quick, precise sample alignment by manually adjusting the DIM knob or by using the Auto Laser Focus.
- Auto Laser Focus – automatically finds the correct focal distance to improve the focusing process for DIM and improve system reproducability. The standard laser focus is still available.
- New Giant Sample Chamber– Large open chamber (580x510x230mm:23x20x9”) is slotted for oversize samples and is easy to load and view from any direction
- 3 Table Options – XY programmable (200x200mm or 12x8” travel)/XY manual (250x250mm or 10x10”)/Fixed position … plus, motorized Z axis as standard with 230mm (9”) travel
- Integrated PC and user interface.
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