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Instrument Database:
Physical Electronics - PHI 1800 Multitechnique XPS System
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| Year of introduction |
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| Status |
available |
| Company |
Physical Electronics
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| Categories |
Surface Analysis: ESCA/XPS
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The PHI 1800 is a high performance MutiTechnique XPS system that can be configured to meet a wide variety of research oriented needs. The hemispherical analyzer and electrostatic input lenses used in the 1800 provide high performance XPS capabilities: unequaled accuracy of quantification, high energy resolution, high sensitivity, and excellent angular resolution. To serve the diverse needs of research and materials science laboratories, an array of standard accessories is available for the 1800.
Some important features of the 1800 MultiTechnique XPS system are:
- Accurate quantitative chemical state analysis of surfaces
- High performance thin film characterization (sputter depth profiling)
- Superior angle dependent analysis (non-destructive depth profiling)
- Effortless analysis of electrically insulating samples
Options for the 1800 MultiTechnique XPS system:
- Achromatic XPS with dual anode x-ray source
- Monochromatic XPS for superior energy resolution
- Ultra-violet photoelectron spectroscopy
- Secondary electron imaging and fixed point Auger analysis
Standard accessories available for the 1800 MultiTechnique XPS system:
- Hot/cold module for the specimen stage
- Motors to automate the specimen stage
- High energy anode materials for the dual anode x-ray source (e.g. Zr, Ag, Au)
- Vacuum or inert atmosphere specimen transfer vessel
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