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Instrument Database:
Shimadzu Corporation - MAXima_X XRD-7000
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| Year of introduction |
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| Status |
available |
| Company |
Shimadzu Corporation
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| Categories |
X-ray spectrometer: XRD
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- High precision vertical θ-θ goniometer that can accept up to 400mm (w) x 5500mm (d) x 400mm (h) maximum.
- Various application of residual austenite quantitation, environmental quantitative analysis, precise lattice constant determination, degree of crystallinity calculations, crystallite size and crystal strain calculations, crystal system determination, rietveld analysis, other software based crystal structure analysis as well as basic qualitative analysis and quantitative analysis.
- Large R-θ stage can accept sample up to 350 mm diameter and 190 mm thickness. Automatic stress mapping is possible.
- Polycapillary optical system that makes high intension parallel X-ray beam (option)
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