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Instrument Database:
Thermo Scientific - K-Alpha - Monochromated, high-performance XPS spectrometer
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| Year of introduction |
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| Status |
available |
| Company |
Thermo Scientific
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| Categories |
Surface Analysis: ESCA/XPS
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The new surface analysis instrument, Thermo Scientific K-Alpha is a fully integrated, monochromated small-spot X-ray Photoelectron Spectrometer (XPS) system.
Product Detail
XPS is already well-established in many branches of materials characterisation and it is now an essential tool for the development of advanced bio-medical surfaces and nano-materials. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make K-Alpha the ideal solution for many existing as well as new surface analysis application areas. K-Alpha is designed for a multi-user environment and is the first XPS tool to deliver fully automated workflow from sample entry to report generation.
Three Operation Modes for Maximum Flexibility
- K-Alpha offers three Operation Modes: Fully automatic mode to minimize user intervention
- Recipe mode for routine analysis
- A fully interactive expert mode
K-Alpha carries out both large and small feature analyses. For small feature analysis and XPS mapping, the monochromated X-ray beam may be focused into a small spot providing an ultimate lateral resolution of 30 µm. A high-flux, low-energy ion source is integral to K-Alpha for depth profiling. Low energy sputtering combined with azimuthal rotation produces profiles with excellent depth resolution.
Configuration
Microfocusing Monochromatic XPS for fast, efficient analysis Accurate chemical state determination- Continuous spot size selection
- Minimise sample damage
- Easy to align
- Spectrum linescans mapping capability
Advanced electron optics maximises precision and throughput Lens: high efficiency, advanced new design- Energy analyser: high resolution.
- Parallel and scanned acquisition
- Snapshot acquisition for rapid profiling and chemical state imaging
- Rapid analysis
- Excellent detectability
Accurate sample navigation for total confidence in the analysis Confidence in analysis position.- Unique lighting system
- o Co-axial for reflective surfaces
- o Diffuse for rough sufaces
- Unique viewing system
- o Platter View for sample to sample navigation
- o Reflex Optics for feture alignment
- o Sample height setting
- Analysis area annotation
- ‘Click and go’ sample navigation and alignment
New ion gun provides optimum profiling conditions - Optimum depth resolution
- o Low energy ion beam
- o Sample rotation
- o Rastered ion beam
- High current to maximise throughput
- Automatic alignment and focusing provides total confidence in your results
New charge compensation system for insulator analysis High resolution spectra- All sample types
- Small and large area analysis
- No user intervention required
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