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Literature / Source Database:
MAPAN - Journal of Metrology Society of India
| Title (short) |
MAPAN |
| Languages |
English |
| Editor |
Sanjay Yadav |
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Status
active
Subject
Source type
Journal
Publisher
ISBN ISSN
0970-3950
E ISSN
0974-9853
First volume
24
Last volume
39+
Homepage
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Availability |
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| Text PDF |
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free access |
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| Text Html |
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for subscriber |
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| References |
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not available |
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| Abstracts |
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| TOC |
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Description
MAPAN-Journal of Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology.
The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
Related subjects » Applied & Technical Physics - Theoretical, Mathematical & Computational Physics
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