European Symposium on Atomic Spectrometry (ESAS) is the international meeting of scientists to share recent developments, exchange ideas, explore new directions and initiate a possible collaboration in the atomic spectrometry area. Leading scientists and researchers will be invited to present their most up-to-date results at this conference, to exchange exciting ideas and experiences as well as look into future development.
The aim of the 15th CSSC is to bring together experts from universities, academia, official centers, various laboratories, and industry on a world-wide scale, to summarize the current progress in different areas of spectroscopy and the trends in the applications such as chemical, environmental, geological, biological, food, pharmaceutical and industrial materials and to stimulate contacts and mutual exchange of experiences.
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Date:
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15.03.2014 - 20.03.2014 |
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National/International:
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International |
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Language:
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English |
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Type:
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Conference |
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Location:
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Prague, Czech Republic |
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Contact:
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Markéta Koželouhová
Ioannes Marcus Marci Spectroscopy Society
Faculty of Science, Masaryk University
Kotlářská 2
CZ - 611 37 BRNO
Czech Republic
email: immss(at)spektroskopie.cz
phone: +420 549 491 436
fax: +420 549 492 494
GSM: +420 722 554 326 |
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Conference web site at:
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Conference topics- Spectroscopy
and spectrometry: theory, techniques, trends, development and
applications in the analysis of the chemical, environmental, geological,
biological, food, pharmaceutical, industrial and other materials
- Atomic spectrometry (AAS, AFS, OES, etc.)
- Molecular spectroscopy (UV-Vis, NMR, Raman, IR, etc.)
- X-ray spectrometry (EDS, WDS, XRF, PIXE, XANES, EXAFS, etc.)
- Mass spectrometry (LC-MS, GC-MS, ESI MS, MALDI – MS, ICP-MS, TIMS, SIMS, etc.)
- Instrumental radioanalytical methods (Gamma spectroscopy, NAA, etc.)
- Mössbauer spectroscopy
- Laser spectroscopy
- Synchrotron techniques
- Special spectroscopy techniques
- Sample preparation and introduction techniques
- Trace and ultratrace analysis
- Speciation analysis
- Quality of measurements and metrology
Deadlines | January 14,2014 | Abstract submission | | January 14,2014 | Registration and payment of registration fee |
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