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Presented by Steven Wilbur
ICP-MS Specialist - Agilent Technologies

Date: 05.11.2008 - 05.11.2008
National/International: International
Language: English
Type: e-Seminar
Location: Internet 11:00 ET / 16:00 GMT (UK) / 17:00 CET
Conference web site at:   http:⁄⁄www.spectroscopynow.com⁄coi⁄cda⁄detail.cda?
id=19355&type=Feature&chId=0&page=1#


 From a performance standpoint (sensitivity, accuracy, linearity), ICP-MS is the undisputed technique of choice for elemental analysis in most applications. However, for applications which don't require state of the art performance, ICP-OES typically has an advantage in productivity in terms of samples run per day. The factors which have constrained the productivity of ICP-MS have included diluting samples to accommodate limited dissolved solids tolerance, gas switching and stabilization times for collision/reaction cell instruments and inefficient sample uptake and rinseout systems. By systematically addressing each of these limitations, Agilent has been able to reduce the typical run to run time for collision cell ICP-MS from 5-6 minutes per sample to a minute or less without adversely impacting the performance. Discussion of the various optimization techniques with example applications and results will be included.

    Attendees will benefit from this live discussion with one of Agilent's ICP-MS Specialists. Hear our expert offer best practices in ICP-MS to help you achieve better results in less time.










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