The EXRS 2006 international conference will be the twelfth in a series of biennial conferences which bring together scientists from the various research fields of X-ray spectrometry, using photon beams, electrons or other energetic particles. Users and experts involved in fundamental and applied research, and/or in methodological and instrumental developments will find this conference an excellent opportunity to present or assess state-of-the-art results or procedures, as well as to establish or renew direct contacts with colleagues during the social program or at the industrial exhibitors’ stands.
The last two conferences were held in Berlin in 2002 and Alghero in 2004.
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Date:
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19.06.2006 - 23.06.2006 |
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National/International:
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International |
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Language:
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English |
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Type:
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Conference |
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Location:
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Paris, France |
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Contact:
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EXRS 2006 Secretariat
Laboratoire National Henri Becquerel
CEA Saclay
F-91191 Gif-sur-Yvette Cedex
France
Tel: +33 (0)1.69.08.52.88
Fax: +33 (0)1.69.08.26.19
E-mail: exrs2006@cea.fr |
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Conference web site at:
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The main topics will include the following aspects of X-ray spectrometry: - EDXRS and WDXRS
- Interaction of X-rays with matter
- Novel X-ray sources, detectors and optics
- TXRF and related techniques
- Microbeam XRS techniques
- XRS Instrumentation at synchrotron facilities
- Grazing angle and polarized radiation XRF
- X-Ray absorption (EXAFS and XANES)
- X-Ray imaging
- Applications of XRS in archaeometry, biomedicine, environment, geology and industry
- Nanotechnology
The program will consist of invited lectures, oral presentations, poster contributions and will include an industrial exhibition.
Deadlines | March 11,2006 | Submission of abstracts | | March 15,2006 | Information of acceptance | | May 1,2006 | Registration at reduced fee | | May 15,2006 | Final announcement | | July 3,2006 | Submission of manuscript |
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