SRM 616/617 - Trace Elements in Glass

SRM 616/617 - Trace Elements in Glass

This  Standard Reference  Material was produced  and certified  to facilitate the  development of trace anaiytical  methods,  and is one oi a series oi four. The nominal trace eiement concentration is 0.02 ppm for each of the sixty-one elements that  have been added to the glass support matrix.

This  material  was prepared  in rod form  and has heen sliced into wafers. The certified  values given are for  an entire  wafer (no fragment  thereof). The debris from  wafering has heen only partially removed and each wafer should  be surface  cleaned  before  use. The first  step  in preparing  the  wafer for  analysis is to wipe it clean with alcohol,  and then  to  give it a mild surface cleaning (not  etch)  in dilute  (1:10) nitric acid. The wafers were cut with a copper-bonded diamond  wheel and the nitric acid step is included  to remove any possihle copper contamination.
 

Considerahle  care and effort  have gone into the manufacturing of this Standard Reference Material to ensure  homogeneity. The  target  Ievel of  precision  and  accuracy  for  certification on this  material  was 10 percent  or better.  To date  no element has heen proven to be outside  this limit for the segment of rod used as the SRM. For those elements that are a particulate suspension in a glass matrix,  a certain  amount of  heterogeneity is expected. For  certification, two  or more  methods 0r lahoratories must  agree to  at least the target level.

keywords: geological materials , trace elements , heavy metals , direct solid sample analysis

a set of six wafers, 3 mm thick, 12-14 mm diameter (SRM 616)
a set of six wafers, 1 mm thick, 12-14 mm diameter (SRM 617)