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The establishment of EVISA is funded by the EU through the Fifth Framework Programme (G7RT- CT- 2002- 05112).


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Instrument Database:

JEOL - JSM-6490LA

Year of introduction
Status available
Company JEOL
Categories Microscopy: Electron: SEM
The JSM-6490LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) developed by JEOL which allows for seamless obervation and EDS anaylsis.

The JSM-6490LA has a high resolution of 3.0nm. The low vacuum mode (which can be accessed by the click of a mouse), allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. Its asynchronous five-axis mechanically eucentric stage with compeucentric rotation and tilt can accommodate a specimen of up to 8-inches in diameter. Standard automated features include Auto Focus/Auto Stigmator, Auto Gun (saturation, bias and alignment), and Automatic Contrast and Brightness.

Other features include:
  • Fast, unattended data acquisition
  • Smart settings for common samples
  • Streamlined design
  • Compact footprint
  • Customized toolbars for repetitive functions
  • Enhanced SE imaging
  • Super conical lens
  • Fully automatic vacuum system
  • Large specimen chamber
  • LV secondary electron detector
New features include:
  • Improved low kV imaging in both high and low vacuum
  • Multiple live image display (including picture in picture)
  • Signal mixing
  • Live, full screen image
  • Video capability (.avi files)
Specifications





Events
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EMEC 24: European Meeting on Environmental Chemistry
26.11.2024
Alicante, Spain
23rd ICFIA: International Conference on Flow Injection Analysis and FRelated Techniques
03.12.2024
The Empress Hotel, Mueang, Chiang Mai, Thailand
PittCon 2025
01.03.2025
Boston, Massachusetts
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