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Instrument Database:
Millbrook Imstruments Limited - Millbrock MiniSIMS
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Millbrook Imstruments Limited
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Mass spectrometer: SIMS/SNMS
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Ranking alongside fibre-optics, the super-conducting magnet and the scanning electron microscope, the Millbrook MiniSIMS has won the Scientific Instrument Makers' Achievement Award. This award is given annually to the single product which is judged to have made the greatest contribution to the British scientific instrument industry. The instrument has also been recognised by R&D Magazine as one of the most technologically significant products on sale in the USA.
These awards are fully deserved. The dedicated design and production have resulted in an instrument suited to the most demanding of environments. Combining an established analytical technique with sophisticated control technology, the Millbrook MiniSIMS is a cost effective instrument for routine analysis or industrial quality control. In universities, the instrument is to be found in the undergraduate teaching facilities as well as the research laboratory.
Cost Effectiveness
Until now, surface analysis has typically involved large, complex and expensive systems based in specialised laboratories. The resources required for operation and maintenance of such equipment restricts its use to a few situations where the expense can be justified.
Conventional SIMS System
A conventional SIMS system in a dedicated laboratory, manned by expert technical personnel and requiring specialist services for operation.
Time is also a problem. Samples must be sent to the centralised facility, which usually means waiting hours or even days for the results - an irritating and expensive delay when a production line is on hold awaiting the results.
The Millbrook MiniSIMS requires only a normal mains electrical socket for operation.
Millbrook MiniSMS
But not any more...
In contrast, the Millbrook MiniSIMS is a mobile instrument, small enough to sit on a desktop wherever it is needed. The capital cost is a small fraction of the price of a conventional laboratory SIMS system with correspondingly low maintenance, consumables, services and other running costs. Many different operators are able to obtain accurate and reproducible results without extensive training. There is even provision for a modem link to allow remote operation of the instrument. And there are massive advantages in speed - a sample can be loaded and results obtained in just a few minutes. The dramatically reduced cost per analysis means that surface investigation can now be a routine procedure.
Capability
The Millbrook MiniSIMS uses Secondary Ion Mass Spectrometry (SIMS) to analyse the surface of a solid object.
Static SIMS (surface analysis)
High energy primary ions are used to dislodge secondary ions from the surface molecular layers. These ions are analysed by mass spectrometry, producing a spectrum to identify both organic and inorganic species.
Imaging SIMS (spatial analysis)
Scanning the focused primary ion beam over the sample surface builds up an image showing the distribution of any species. This is ideal for analysing the uniformity of coatings or the composition of small features.
Dynamic SIMS (depth analysis)
By concentrating the primary beam into a small area, the surface layers are progressively etched away. This produces an analysis of the subsurface region, monitoring the thickness and composition of thin films.
Applications
All solid objects interact with their environment through the surface. Many industries are now realising the benefits of controlling and characterising the surface molecular layers, and are using surface engineering to create materials with tailored surfaces for enhanced performance.
Establishing the chemical composition of a surface is therefore a vital step towards understanding its behaviour. The MiniSIMS uses Secondary Ion Mass Spectrometry (SIMS) to analyse the surface of a solid object.
The Millbrook MiniSIMS provides
- True surface analysis
- Detection of all elements
- Identification of organic species
- High sensitivity
- Fast chemical imaging
- Thin film profiling
in a unique desktop instrument designed to make surface analysis fast and affordable.
The higher performance TOF version of the MiniSIMS, based on a time of flight mass spectrometer, offers complete retrospective data analysis capability. It has significant advantages for:
- analysis of unknown samples e.g. troubleshooting as well as quality control
- analysis of unique areas e.g. defects
- analysis of organic materials
- analysis of small areas (100 micron and below)
The Millbrook MiniSIMS is used for the analysis of
Surface Coatings & Treatments • Electronic Components • Semiconductors • Electrodes & Sensors • Lubricants • Catalysts • Adhesives • Thin Films • Packaging Materials • Corrosion Studies
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